Background Information

• Doctor of Philosophy, 1991, University of Texas, Austin
• Master of Science, 1984, Tsinghua Universit, Beijing China
• Bachelor’s of Science, 1982, Tsinghua University, Beijing China

Refereed Articles

• Meric, I., Kim, J., Gong, L., & Meric, G. (in press, 2012). Co-movements of and Linkages between Asian Stock Markets. Business and Economics Research Journal, 3 (1).
• Gong, L. (2012). Impact of Type I and Type II Errors of Testing Equipment on System Performance in a Repetitive Chip Testing Process. European Journal of Operational Research, 220 (1), 115-124.
• Meric, I., Prober, L., & Gong, L. (in press, 2011).  Co-Movements of Global Stock Markets Before and After the 2008 Stock Market Crash.  International Research Journal of Finance and Economics.   Ding, J. & Gong, L. (2008).  The Effect of Testing Equipment Shift on Optimal Decisions in a Repetitive Testing Process.  European Journal of Operational Research.

Refereed Proceedings
Full Paper 

• Gong, L. (2009).  Design an Efficient Repetitive Testing Process in Semiconductor Manufacturing.  14th Annual Asia Pacific Decision Sciences Conference.   

Presentation of Refereed Papers
International 

• Meric, I., Prober, L., Gong, L., & Meric, G. (2010, June). Co-Movements of Global Stock Markets Before and After the 2008 Stock Market Crash.   Euroasia Economics and Business Society Conference (EBES), Istanbul, Turkey.
• Gong, L. (2009, July). Design an Efficient Repetitive Testing Process in Semiconductor Manufacturing.   14th Annual Asia Pacific Decision Sciences Conference, Shanghai, China.
• Gong, L. & Ding, J. (2008, August). An Interactive Repetitive Chip Testing Model.   3rd World Conference on Production and Operations, Tokyo, Japan.